Facilities and Fees
A summary of fees and facilities at each node are shown below. All nodes differentiate between internal and external users, some also between external academic and non-academic users. The system for financing infrastructures varies significantly between the facilities. Therefore, internal instrument fees can vary from being very low to close to the same as for external users. The fees for external academic users also vary between the nodes. It is therefore recommended to contact the nodes to get detailed information about the fees at that node.
EM-lab – KTH
Special competences: Characterization of nanoparticulate matters including films and coatings, semiconductor circuits, cellulosic materials as well as metals and minerals are some of the main areas.
Contact person: Dr Fei Ye, email@example.com
For sample preparation and other instruments, visit myfab:s homepage.
UEM – Materials Physics, Kista Electrum
Special competence: Ultrafast Electron Microscopy. The microscope is a customised JEOL 2100 with a thermionic emitter, additional electron optics, and a Gatan Quantum SE imaging energy filter. The drive laser is an Amplitude Systems Tangerine 35 W (300 fs). The demonstrated time resolution of the UEM is < 800 fs.
Contact person: Associate Professor Jonas Weissenrieder firstname.lastname@example.org
Fibre and polymer technology (FPT)
Special competences: TEM, SEM and EDS analysis of fibre and polymer materials. In-situ SEM mechanical testing. Sample preparation with the Cryosectioning Ultramicrotome.
External academic users pay 90% of instrument fees.
Contact person: Dr Anastasia Riazanova email@example.com
Sample preparation and other EM instruments, visit FPT’s homepage.
Materials science and engineering (MSE)
Special competences: Sample preparation and electron microscopy (TEM, SEM, FIB-SEM) of metallic materials etc.
For external academic users, contact the facility
Contact person: Peter Hedström firstname.lastname@example.org
EMC – Stockholm University
EM-lab – Uppsala University
Special competences: EELS, EMCD, EDS, Imaging and Spectroscopic TEM 3D tomography, Soft materials TEM, FIB-TEM cryo preparation, FIB TEM lamella preparation, In-situ TEM, Phase contrast HRTEM imaging and simulation, image analysis
Contact person: Klaus Leifer email@example.com
EM-lab – SWERIM
SWERIM is a research institute and normally provide SEM and TEM studies as contract research and as an important tool short or long research projects.
Special competences: EM and microanalysis on commercial materials with special focus on steels, stainless steels and other metallic alloys. Surfaces including local hardening and surface protection coatings. Analysis of corrosion processes at ambient temperatures in different environments and high temperatures. Analysis of microstructures in powder materials and additive manufacturing, polymers etc. Sample preparation with conventional metallographic techniques and ion milling, etching and coating (FIB, BIB, PIPS, PECS).
Contact person: Joacim Hagström firstname.lastname@example.org
For sample preparation and price including operator and research cooperation, contact SWERIM at 08-4404800 or visit Swerim’s webpage for further information.